Huge transistor counts, rising on-chip clock rates, the relentlessly escalating levels of integration in systems-on-chip, and the new types of defects seen in deep-submicron and nanometer processes ...

This in-depth discussion of scan-based testing explores the benefits, implementation, and possible problems of AC scan. Today�s large, complex chips present an entirely new set of test issues for ...

Huge transistor counts, rising on-chip clock rates, relentlessly escalating levels of integration in systems-on-chip, and new types of defects seen in deep-submicron and nanometer processes are ...