First invented in 1985 by IBM in Zurich, Atomic Force Microscopy (AFM) is a scanning probe technique for imaging. It involves a nanoscopic tip attached to a microscopic, flexible cantilever, which is ...

Editor’s note: Neighbor Spotlight is a monthly feature that aims to let our readers learn more about the people in their communities who are working to make them a better place, who have interesting ...

Microscopy continues to transform the life sciences. Here are five recent breakthroughs made possible by the technique.

Invented 30 years ago, the atomic force microscope has been a major driver of nanotechnology, ranging from atomic-scale imaging to its latest applications in manipulating individual molecules, ...

Atomic Force Microscopy (AFM) has evolved into a central technique in nanotechnology, providing three-dimensional imaging and precise measurements at the atomic scale. Its ability to probe surfaces by ...

A new AI model generates realistic synthetic microscope images of atoms, providing scientists with reliable training data to accelerate materials research and atomic scale analysis. (Nanowerk ...

SANTA BARBARA, Calif.--(BUSINESS WIRE)--Oxford Instruments Asylum Research announced today that its next-generation Atomic Force Microscope (AFM), Vero, has received three prestigious awards. Vero AFM ...

Researchers at Oak Ridge National Laboratory have used specialized tools to study materials at the atomic scale and analyze ...

Scientists at Lawrence Berkeley National Laboratory made a big leap in their research into all things small. Within the past few months, scientists there began using what they say is the world’s most ...

Polymer materials play an increasingly important role in a variety of industrial applications, thanks to their distinct physical and chemical properties. Among their key mechanical characteristics, ...