Using the fault and test diagnosis software, a design can be fully tested for potential part failures. Larry Meares and Tim Ghazaleh, Intusoft, Gardena, Calif. Referencing the March 2003 issue of ...
Scan diagnosis is an established method for identifying and locating semiconductor defects on devices that fail manufacturing test and on field returns. Effectively selecting the right devices for ...
As integrated circuits grow in content and complexity, reaching target yield levels becomes challenging. A product engineer's worst nightmares frequently become reality: sample devices are supposed to ...
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