Researchers can now detect the formation of keyhole pores, one of the most challenging defects common in additive manufacturing, with incredible accuracy. A research team led by Tao Sun, associate ...
Morning Overview on MSN
A hidden defect may be behind widespread EV battery failures
Electric vehicles are supposed to be the low‑maintenance workhorses of the energy transition, yet a growing trail of recalls, ...
Researchers from EPFL have resolved a long-standing debate surrounding laser additive manufacturing processes with a pioneering approach to defect detection. Researchers from EPFL have resolved a long ...
Almost 350,000 miles of interstate gas and hazardous liquid transmission pipelines transport products across the U.S. The quality of individual components used in constructing these pipelines is ...
A growing number of academic and industrial research groups regard the integration of artificial intelligence-based algorithms into the 3D printing process as a promising approach to improve the ...
Optical 3D metrology enables fast, non-contact surface roughness measurement of defects and roughness for precise ...
SEMVision™ H20 enables better and faster analysis of nanoscale defects in leading-edge chips Second-generation “cold field emission” technology provides high-resolution imaging AI image recognition ...
As transistors scale down, they need thinner channels to achieve adequate channel control. In silicon, though, surface roughness scattering degrades mobility, limiting the ultimate channel thickness ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback