There are a number of essential parameters which must be accounted for when undertaking electron microscopy (EM). When correctly taken into account, these can help produce the best possible results ...
In recent years, STEM-in-SEM (the industry acronym for Scanning Transmission Electron Microscopy in an SEM) has increased in popularity for a number of experts. This technique has drawn attention from ...
The interaction volume of a characteristic X-Ray emission can be seen in Figure 1. Typical EDS analysis in an SEM is carried out at relatively high energy (greater than 10 kV), which results in a vast ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback