An AFM instrument uses a probe with an atomically sharp tip to scan over the surface of a material. There are two main scanning modes with an AFM instrument: contact or dynamic (tapping) mode. Both ...

CSInstruments' Galaxy Dual Controller reinvigorates existing atomic force microscopy (AFM) systems, turning AFMs like the MultiMode, 5100, and 5500, into cutting-edge instruments for advanced research ...

Photothermal AFM-IR, commonly referred to as AFM-IR, is an analytical technique used to understand the chemistry of a material at the nanoscale. It combines the nanoscale spatial resolution of atomic ...

Photothermal AFM-IR, or AFM-IR, is an analytical method used for chemical identification in a materials sample at the nanoscale. AFM-IR incorporates both the nanoscale spatial resolution of atomic ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

The Asylum Research MFP-3D Origin+ Atomic Force Microscope offers high-resolution imaging, supports large samples, and comes with a full range of imaging modes and accessories. Cantilevers are located ...