(MENAFN- JCN NewsWire) Hitachi High-Tech Launches Dark Field Wafer Defect Inspection System DI4600 to Provide High Throughput and High-Precision Defect Detection on Patterned Wafers TOKYO, Dec 6, 2023 ...
The new generation of rectangular silicon wafers represents a significant technological direction for the industry, offering increased module power, optimized container utilization, and reduced system ...
TOKYO, Jun 3, 2022 - (JCN Newswire) - Hitachi High-Tech Corporation announced the launch of the Hitachi Dark Field Wafer Defect Inspection System DI2800, a critical component in any semiconductor ...
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